Memory corruption via mismatched LUT channel count
Published Mar 10, 2026 · Updated Mar 10, 2026
Stack-based buffer overflow in iccDEV before 2.3.1.5 allows context-dependent attackers to corrupt memory via a crafted ICC profile. CIccXform3DLut::Begin() fails to verify that a LUT output-channel count matches its output color space, so Apply() writes past the XYZbp stack buffer. A user must process the profile with an affected application, after which the overwrite can crash the process or corrupt stack memory.
Summary
What happened
Stack-based buffer overflow in iccDEV before 2.3.1.5 allows context-dependent attackers to corrupt memory via a crafted ICC profile. CIccXform3DLut::Begin() fails to verify that a LUT output-channel count matches its output color space, so Apply() writes past the XYZbp stack buffer. A user must process the profile with an affected application, after which the overwrite can crash the process or corrupt stack memory.
The record
- CVE
- CVE-2026-31795
- Published
- Mar 10, 2026
- Updated
- Mar 10, 2026
- Vendor
- International Color Consortium
- Product
- iccDEV
- Classifications
- CWE-787, CWE-121, CWE-120, T1203, T1204.002
- Attack vector
- local
- Privileges
- unauthenticated
Timeline
How it unfolded
- Mar 10, 2026CVE publishedPublication date reported by the CVE source.
- Mar 10, 2026Record updatedLatest update available in the CVE record.
Exploitability
Present is not the same as exploitable
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Is a vulnerable build present?
Compare these published version ranges with your installed build and any vendor patches.
- Affected versionversion=< 2.3.1.5
What conditions does exploitation require?
What is affected?
Published CVSS scores
CVSS describes severity. EPSS estimates exploitation probability.
Attacks
What attackers are doing with it
Daily unique IPs observed by Shadowserver honeypots for known exploited vulnerabilities (KEVs). Missing observations do not establish an absence of attacks.
Weakness, pattern, technique
Public exploit references
- Malformed ICC profile proof of conceptproof of concept · demonstrated
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Technologies
Your stack
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Your stack
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