Memory corruption via factory-test IOCTL overflow
Published Dec 2, 2024 · Updated Dec 3, 2024
Stack-based buffer overflow in Qualcomm Snapdragon WLAN Host allows local users to corrupt memory through a factory-test IOCTL command. The WLAN driver accepts a user-space factory-test request through an IOCTL and writes beyond a stack buffer while processing the command. A local low-privileged account is required; successful exploitation can compromise confidentiality, integrity, and availability, but Qualcomm has not disclosed the vulnerable function or input field.
Summary
What happened
Stack-based buffer overflow in Qualcomm Snapdragon WLAN Host allows local users to corrupt memory through a factory-test IOCTL command. The WLAN driver accepts a user-space factory-test request through an IOCTL and writes beyond a stack buffer while processing the command. A local low-privileged account is required; successful exploitation can compromise confidentiality, integrity, and availability, but Qualcomm has not disclosed the vulnerable function or input field.
The record
- CVE
- CVE-2024-43050
- Published
- Dec 2, 2024
- Updated
- Dec 3, 2024
- Vendor
- Qualcomm
- Product
- Qualcomm WCN3660B Firmware
- Classifications
- CWE-121
- Attack vector
- local
- Privileges
- authenticated
Timeline
How it unfolded
- Dec 2, 2024CVE publishedPublication date reported by the CVE source.
- Dec 3, 2024Record updatedLatest update available in the CVE record.
Exploitability
Present is not the same as exploitable
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- Affected versionversion=0 <=*
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What is affected?
Published CVSS scores
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Attacks
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Public exploit references
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Technologies
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